Gabor A. Somorjai (University of
"Sum frequency generation-vibrational
spectroscopy characterization of surface monolayers:
Catalytic reaction intermediates and polymer
Akira Tonomura (Hitachi, Ltd.,
RIKEN, JST, SORST)
"Observation of unconventional behavior of
vortices in high-Tc superconductors"
Matthias Bode (Univ. Hamburug)
"Imaging of magnetic surfaces, films, and
clusters by spin-polarized STM"
Karl-Heinz Rieder (Beriln Frei
"Doing physics and chemistry with single atoms
and molecules: The STM as operative instrument"
Peter Varga (TU Vienna)
"STM study on the local atomic surface structure
of ultrathin Fe films and the INVAR alloy"
Ernst Meyer (Univ. of Basel)
"Force microscopy investigations of molecules on
Wolf-Dieter Schneider (Univ.
"Two-dimensional self-assembly of molecules and
of magnetic adatoms on metal surfaces"
Henning Neddermeyer (Martin-Luther
"Manipulation experiments on Si and surface
dynamics by high-temperature STM"
Seizo Morita (Osaka Univ.)
"Atom selective imaging and mechanical atom
manipulation based on noncontact atomic force
Qi-Kun Xue (Institute of Physics,
The Chinese Academy of Sciences)
"Growth and magnetic properties of nanodot
arrays on Si(111)"
Hisataka Takenaka (NTT-AT)
"Multilayer films for X-ray microscope"
Harald Rose (TU Darmstadt)
"Prospects of aberration-free electron
Yoshizo Takai (Osaka Univ.)
"Phase transmission electron microscopy with
aberration correction based on active defocus
Yimei Zhu (Brookhaven National
"Accurate measurements of valence electron and
induction distribution in superconductors and
magnetic materials using advanced electron
Jean-Jacques Metois (Marseille
"REM investigation of the dynamic of steps"
J. Wayne Rabalais (Univ. of
"Real space surface crystallography from low
energy ion scattering"
Marika Schleberger (Univ. Essen)
"Analysis of magnetic surfaces by scattering of
low energy ions"
Andreas Heinrich (IBM Almaden
"Using scanning tunneling microscopy as a tool
for nanotechnology, molecule cascades: Concepts and
Yoshikazu Homma (NTT)
"Self-assembled nanotube network for nano-device
Barney L. Doyle (Sandia National
"Ion-induced emission microscopy"
Richard Palmer (Univ. of
"Nanostructured surfaces: fabrication by
size-selected clusters, characterisation by local STM
spectroscopy (SPELS) and application to
immobilisation of proteins"
Margret Giessen (Research Center
"Quantitative analysis of atom transport
phenomena at solid-vacuum and solid-liquid
Tien T. Tsong (Academia Sinica)
"The dynamic properties of Si and metal atoms on
Harald Ibach (Research Center
"Universal model for the potential dependence of
surface defect formation energies and activation
energies for atom transport on solid surfaces in
contact with an electrolyte"
Anastassia Pavlovska (Arizona State
"Surface reconstructions and disordering in two
and three dimensions: the case of indium"
Maya Kiskinova (Elettra)
"Chemical specific imaging and
micro-spectroscopy of interfaces and dynamic surface
processes with synchrotron-based techniques"
Ernst Bauer (Arizona State Univ.)
"Nanomagnetism studies with SPLEEM and
Takanori Koshikawa (OECU)
"Surface observation by LEEM and PEEM and high
resolution PEEM by focus moving method"
Michael Altman (Hong Kong STU)
"Low energy electron microscopy of the quantum
electronic and magnetic properties of ultrathin
Thomas Schmidt (U. Würzburg)
"Spectromicroscopy with high lateral and
spectral resolution: the SMART project at BESSY
Chuhei Oshima (Waseda Univ)
"Coherent electron beam"
Roger Morin (Marseille University)
"Imaging with low-energy electron coherent
Jianwei Miao (SSRL)
"Towards atomic resolution 3D diffraction
microscopy with coherent X-rays and electrons"
David C. Joy (Univ. of Tennessee)
"Electron holography at ultra-low and at high
Yoshimasa Nihei (Tokyo Uinv. of
"3D atomic structural analysis of surface
nano-sturucture by photoelectron diffraction and
C. S. Fadley (Univ. of California)
"Holographic imaging of local atomic structure:
Where is it and where can it go?"
Juerg Osterwalder (Universitaet
"Growth morphology and defect structures on
hexagonal boron nitride films on Ni(111): a combined
STM and XPD study"
Shozo Kono (Tohoku Univ.)
"Surface structure determination by
photoelectron diffraction and electron
Hannes Lichte (Dresden University)
"50 years of the electron biprism - 50 years of
exciting electron physics"
Tsukasa Hirayama (Japan Fine
"Electron wave interference by biprism and its
Akira Nishiyama (Toshiba)
"Characterization of high-k materials for the
advancement of high-speed ULSIs' "
Torgny Gustafsson (Rutgers Univ.)
"Ion scattering studies of alternate gate
Hide H. Brongersma (Eindhoven
University of Technology and Calipso B.V )
"Ultra-thin layers and interfaces in
microelectronics studied by LEIS"
Yoshiaki Kido (Ritsumeikan Univ.)
"Atomic level characterization of HfO2/Si(001)
by medium energy ion scattering coupled with
SR-photoelectron spectroscopy "
Hee Jae Kang (Chungbuk National
"Sub-nm depth resolution in sputter depth
profiling by low energy ion bombardment"
Toshiyuki Fujimoto (AIST)
"Application of metal cluster ion beam for low
Masahiko Inoue (Setsunan Univ.)
"High resolution Auger depth profiling by sub
keV ion sputtering"
Bunji Mizuno (Ultimate Junction
"Formation process and characterization of
Masakazu Aono (Nanomaterials
Laboratory & Osaka University)
"Novel methods of nanoscale fabrication and
Werner Heiland (Universitat
"What do we know about the elctronic corrugation
of surfaces ?"
Yasu Fujikawa (Tohoku University,
Japan and University of Wisconsin, USA)
"STM study on the atomic structure of Ge(105)
Oliver C. Wells (IBM)
"The early history of the SEM and some recent
Takeo Ichinokawa (Waseda
"Instrument development in my laboratory"
Amand A. Lucas (FUNDP)
"Diffraction of X-rays and of electrons by
helical molecules: Determination of the structure of
DNA and carbon nanotubes"
David B. Williams (Lehigh
"Quantitative compositional mapping in the
analytical electron microscope"
Dale Newbury (NIST)
"Improving the sensitivity of electron probe
microanalysis by enhanced X-ray spectrometry: X-ray
optic augmented wavelength-dispersive X-ray
spectrometry; X-ray microcalorimetry; and silicon
drift detector energy dispersive X-ray
Ernst Bauer (Arizona State Univ.)
"Surface electron microscopy with slow
Ryuichi Shimizu (Osaka Inst.
"Atomic level characterization in development of
cathodes of high brightness"
Paul W. Palmberg (ULVAC-PHI Inc.,
Physical Electronics USA, Inc.)
"Surafce Analysis" (tentative)
- Surface analysis and
nano-order characterization by JEOL
1) Masaru Takakura : "Introduction
of Schottky Type Field Emission Electron Probe
2) Toyohiko Tazawa: "Micrometer to Nanometer
Surface Characterization by XPS and SAM"
3) Chuck Mooney: "Application of ambient and