Volha V. Abidzina (Belarusian - Russian University)
"Surface modification in metals by the
low-energy ion irradiation in discharge plasma"
Jeremy Brison (University of Namur)
"Cesium/Xenon co-sputtering and ToF-SIMS depth
profiling: A fundamental survey through the periodic
Takuya Bungo (Osaka University)
"Dependence of depth resolution on primary
energy of ions in sputter depth profiling"
Takahiro Itagaki (Waseda University)
"Field emission from a single-atom tip: Apex
structure dependences of field emission
Takeshi Iyasu (Osaka Institute of Technology)
"A novel approach to derive escape depth of
secondary electrons as applied to Ti and TiO2"
Hidehiro Mochizuki (Tokyo University of Science)
"Surface structural analysis of h-BN/Ni(111) by
X-ray photoelectron diffraction excited by Al-Ka line
and Cr-Ka line"
Akihiko Nakaguchi (Osaka Electro-Communication
"Sb on In/Si(111) processes with dynamically
observable LEEM, selected area LEED and chemically
Naoya Sakamoto (Hokkaido University)
"High sensitive ion imaging system using direct
combination of stacked-type solid-state imager and
microchannel plate driven by LabVIEW software"
Shuichi Shimma (National Institute for Physiological
"Direct MS/MS analysis in mammalian tissue
sections using MALDI-QIT-TOFMS and chemical inkjet
Daisuke Takagi (Tokyo University of Science)
"In-situ scanning electron microscopy of
single-walled carbon nanotube growth"